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-rw-r--r--Documentation/ABI/testing/sysfs-bus-iio11
1 files changed, 11 insertions, 0 deletions
diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio
index e81ba6f5e1c8..7faec5b3a553 100644
--- a/Documentation/ABI/testing/sysfs-bus-iio
+++ b/Documentation/ABI/testing/sysfs-bus-iio
@@ -2038,3 +2038,14 @@ Description:
Available range for the forced calibration value, expressed as:
- a range specified as "[min step max]"
+
+What: /sys/bus/iio/devices/iio:deviceX/in_voltageX_sampling_frequency
+What: /sys/bus/iio/devices/iio:deviceX/in_powerY_sampling_frequency
+What: /sys/bus/iio/devices/iio:deviceX/in_currentZ_sampling_frequency
+KernelVersion: 5.20
+Contact: linux-iio@vger.kernel.org
+Description:
+ Some devices have separate controls of sampling frequency for
+ individual channels. If multiple channels are enabled in a scan,
+ then the sampling_frequency of the scan may be computed from the
+ per channel sampling frequencies.