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-rw-r--r--Documentation/ABI/testing/sysfs-class-mtd17
1 files changed, 14 insertions, 3 deletions
diff --git a/Documentation/ABI/testing/sysfs-class-mtd b/Documentation/ABI/testing/sysfs-class-mtd
index 3105644b3bfc..bfd119ace6ad 100644
--- a/Documentation/ABI/testing/sysfs-class-mtd
+++ b/Documentation/ABI/testing/sysfs-class-mtd
@@ -128,9 +128,8 @@ KernelVersion: 3.4
Contact: linux-mtd@lists.infradead.org
Description:
Maximum number of bit errors that the device is capable of
- correcting within each region covering an ecc step. This will
- always be a non-negative integer. Note that some devices will
- have multiple ecc steps within each writesize region.
+ correcting within each region covering an ECC step (see
+ ecc_step_size). This will always be a non-negative integer.
In the case of devices lacking any ECC capability, it is 0.
@@ -173,3 +172,15 @@ Description:
This is generally applicable only to NAND flash devices with ECC
capability. It is ignored on devices lacking ECC capability;
i.e., devices for which ecc_strength is zero.
+
+What: /sys/class/mtd/mtdX/ecc_step_size
+Date: May 2013
+KernelVersion: 3.10
+Contact: linux-mtd@lists.infradead.org
+Description:
+ The size of a single region covered by ECC, known as the ECC
+ step. Devices may have several equally sized ECC steps within
+ each writesize region.
+
+ It will always be a non-negative integer. In the case of
+ devices lacking any ECC capability, it is 0.