summaryrefslogtreecommitdiff
path: root/drivers/mtd/tests
AgeCommit message (Collapse)AuthorFilesLines
2009-01-05[MTD] [TESTS] Fix some size_t printk format warningsDavid Woodhouse2-4/+4
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2008-12-10MTD: add MTD tests to compilationArtem Bityutskiy1-0/+7
Add MTD tests to Kconfig and Makefiles. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-10MTD: tests: add mtd_torturetestArtem Bityutskiy1-0/+530
This test is designed to work for very long time and it tries to wear few eraseblocks. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08MTD: tests: add mtd_subpagetestArtem Bityutskiy1-0/+525
This tests makes sure sub-pages on NAND MTD device work fine. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08MTD: tests: add mtd_stresstestArtem Bityutskiy1-0/+330
This test just performs random operations on random eraseblocks. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08MTD: tests: add mtd_speedtestArtem Bityutskiy1-0/+502
This test examines I/O speed of the flash device. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08MTD: tests: add mtd_readtestArtem Bityutskiy1-0/+253
A simple tests which reads whole MTD device one page at a time. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08MTD: tests: add mtd_pagetestArtem Bityutskiy1-0/+632
This test checks that NAND pages read/write work fine. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08MTD: tests: add mtd_oobtestArtem Bityutskiy1-0/+742
This test checks that OOB of a NAND MTD device works fine. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>