From d7f1b59655efb5a285d227c8f9853a98eab5c2fd Mon Sep 17 00:00:00 2001 From: Hayes Wang Date: Wed, 22 Jan 2020 16:02:10 +0800 Subject: r8152: disable test IO for RTL8153B For RTL8153B with QFN32, disable test IO. Otherwise, it may cause abnormal behavior for the device randomly. Signed-off-by: Hayes Wang Signed-off-by: David S. Miller --- drivers/net/usb/r8152.c | 10 ++++++++++ 1 file changed, 10 insertions(+) (limited to 'drivers/net/usb/r8152.c') diff --git a/drivers/net/usb/r8152.c b/drivers/net/usb/r8152.c index 1fb85c79bd33..7efeddad1fc8 100644 --- a/drivers/net/usb/r8152.c +++ b/drivers/net/usb/r8152.c @@ -312,6 +312,7 @@ /* PLA_PHY_PWR */ #define TX_10M_IDLE_EN 0x0080 #define PFM_PWM_SWITCH 0x0040 +#define TEST_IO_OFF BIT(4) /* PLA_MAC_PWR_CTRL */ #define D3_CLK_GATED_EN 0x00004000 @@ -5538,6 +5539,15 @@ static void r8153b_init(struct r8152 *tp) ocp_data &= ~PLA_MCU_SPDWN_EN; ocp_write_word(tp, MCU_TYPE_PLA, PLA_MAC_PWR_CTRL3, ocp_data); + if (tp->version == RTL_VER_09) { + /* Disable Test IO for 32QFN */ + if (ocp_read_byte(tp, MCU_TYPE_PLA, 0xdc00) & BIT(5)) { + ocp_data = ocp_read_word(tp, MCU_TYPE_PLA, PLA_PHY_PWR); + ocp_data |= TEST_IO_OFF; + ocp_write_word(tp, MCU_TYPE_PLA, PLA_PHY_PWR, ocp_data); + } + } + set_bit(GREEN_ETHERNET, &tp->flags); /* rx aggregation */ -- cgit v1.2.3