diff options
| author | Simon Glass <sjg@chromium.org> | 2020-07-29 04:41:12 +0300 |
|---|---|---|
| committer | Tom Rini <trini@konsulko.com> | 2020-08-08 05:31:32 +0300 |
| commit | e180c2b129016baf21086eca73767844e7eff185 (patch) | |
| tree | 9024230dcb1a4f3480cc18a4bed4e965ff406d51 /include | |
| parent | bd34715599c17e0d3f09af1cdfba8af120bc8602 (diff) | |
| download | u-boot-e180c2b129016baf21086eca73767844e7eff185.tar.xz | |
dm: Rename DM test flags to make them more generic
The test flags used by driver model are currently not available to other
tests. Rather than creating two sets of flags, make these flags generic
by changing the DM_ prefix to UT_ and moving them to the test.h header.
This will allow adding other test flags without confusion.
Signed-off-by: Simon Glass <sjg@chromium.org>
Diffstat (limited to 'include')
| -rw-r--r-- | include/dm/test.h | 9 | ||||
| -rw-r--r-- | include/test/test.h | 10 |
2 files changed, 10 insertions, 9 deletions
diff --git a/include/dm/test.h b/include/dm/test.h index 2c92d41278..b2adce730a 100644 --- a/include/dm/test.h +++ b/include/dm/test.h @@ -144,15 +144,6 @@ struct dm_test_state { struct udevice *removed; }; -/* Test flags for each test */ -enum { - DM_TESTF_SCAN_PDATA = 1 << 0, /* test needs platform data */ - DM_TESTF_PROBE_TEST = 1 << 1, /* probe test uclass */ - DM_TESTF_SCAN_FDT = 1 << 2, /* scan device tree */ - DM_TESTF_FLAT_TREE = 1 << 3, /* test needs flat DT */ - DM_TESTF_LIVE_TREE = 1 << 4, /* needs live device tree */ -}; - /* Declare a new driver model test */ #define DM_TEST(_name, _flags) UNIT_TEST(_name, _flags, dm_test) diff --git a/include/test/test.h b/include/test/test.h index 029288de88..ff92c39006 100644 --- a/include/test/test.h +++ b/include/test/test.h @@ -7,6 +7,7 @@ #define __TEST_TEST_H #include <malloc.h> +#include <linux/bitops.h> /* * struct unit_test_state - Entire state of test system @@ -27,6 +28,15 @@ struct unit_test_state { char actual_str[256]; }; +/* Test flags for each test */ +enum { + UT_TESTF_SCAN_PDATA = BIT(0), /* test needs platform data */ + UT_TESTF_PROBE_TEST = BIT(1), /* probe test uclass */ + UT_TESTF_SCAN_FDT = BIT(2), /* scan device tree */ + UT_TESTF_FLAT_TREE = BIT(3), /* test needs flat DT */ + UT_TESTF_LIVE_TREE = BIT(4), /* needs live device tree */ +}; + /** * struct unit_test - Information about a unit test * |