diff options
| author | Simon Glass <sjg@chromium.org> | 2020-07-29 04:41:12 +0300 |
|---|---|---|
| committer | Tom Rini <trini@konsulko.com> | 2020-08-08 05:31:32 +0300 |
| commit | e180c2b129016baf21086eca73767844e7eff185 (patch) | |
| tree | 9024230dcb1a4f3480cc18a4bed4e965ff406d51 /test/dm/i2c.c | |
| parent | bd34715599c17e0d3f09af1cdfba8af120bc8602 (diff) | |
| download | u-boot-e180c2b129016baf21086eca73767844e7eff185.tar.xz | |
dm: Rename DM test flags to make them more generic
The test flags used by driver model are currently not available to other
tests. Rather than creating two sets of flags, make these flags generic
by changing the DM_ prefix to UT_ and moving them to the test.h header.
This will allow adding other test flags without confusion.
Signed-off-by: Simon Glass <sjg@chromium.org>
Diffstat (limited to 'test/dm/i2c.c')
| -rw-r--r-- | test/dm/i2c.c | 16 |
1 files changed, 8 insertions, 8 deletions
diff --git a/test/dm/i2c.c b/test/dm/i2c.c index 25b2c7c617..681ce45107 100644 --- a/test/dm/i2c.c +++ b/test/dm/i2c.c @@ -42,7 +42,7 @@ static int dm_test_i2c_find(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_i2c_find, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); +DM_TEST(dm_test_i2c_find, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); static int dm_test_i2c_read_write(struct unit_test_state *uts) { @@ -59,7 +59,7 @@ static int dm_test_i2c_read_write(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_i2c_read_write, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); +DM_TEST(dm_test_i2c_read_write, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); static int dm_test_i2c_speed(struct unit_test_state *uts) { @@ -81,7 +81,7 @@ static int dm_test_i2c_speed(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_i2c_speed, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); +DM_TEST(dm_test_i2c_speed, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); static int dm_test_i2c_offset_len(struct unit_test_state *uts) { @@ -98,7 +98,7 @@ static int dm_test_i2c_offset_len(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_i2c_offset_len, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); +DM_TEST(dm_test_i2c_offset_len, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); static int dm_test_i2c_probe_empty(struct unit_test_state *uts) { @@ -113,7 +113,7 @@ static int dm_test_i2c_probe_empty(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_i2c_probe_empty, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); +DM_TEST(dm_test_i2c_probe_empty, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); static int dm_test_i2c_bytewise(struct unit_test_state *uts) { @@ -168,7 +168,7 @@ static int dm_test_i2c_bytewise(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_i2c_bytewise, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); +DM_TEST(dm_test_i2c_bytewise, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); static int dm_test_i2c_offset(struct unit_test_state *uts) { @@ -241,7 +241,7 @@ static int dm_test_i2c_offset(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_i2c_offset, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); +DM_TEST(dm_test_i2c_offset, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); static int dm_test_i2c_addr_offset(struct unit_test_state *uts) { @@ -306,4 +306,4 @@ static int dm_test_i2c_addr_offset(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_i2c_addr_offset, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); +DM_TEST(dm_test_i2c_addr_offset, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); |