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author | Rajan Vaja <rajan.vaja@xilinx.com> | 2018-09-19 13:43:46 +0300 |
---|---|---|
committer | Simon Glass <sjg@chromium.org> | 2018-09-29 20:49:35 +0300 |
commit | 31b8217e83a63d1c8c70edcdcdf5aff3b1791640 (patch) | |
tree | d402e86d8d1045f15be37041c5772ea1f1e07604 /test/dm | |
parent | e7a52ba65be227f4fa06b851d1d92af1bef694e0 (diff) | |
download | u-boot-31b8217e83a63d1c8c70edcdcdf5aff3b1791640.tar.xz |
dm: test: Add "/firmware" node scan test
Add a test which verifies that all subnodes under "/firmware"
nodes are scanned.
Signed-off-by: Rajan Vaja <rajan.vaja@xilinx.com>
Reviewed-by: Simon Glass <sjg@chromium.org>
Added 'imply FIRMWARE' to sandbox Kconfig to fix test failures, fixed
ordering of lines in arch/sandbox/dts/test.dts and test/dm/Makefile,
updated #if condition in drivers/firmware/firmware-uclass.c:
Signed-off-by: Simon Glass <sjg@chromium.org>
Diffstat (limited to 'test/dm')
-rw-r--r-- | test/dm/Makefile | 1 | ||||
-rw-r--r-- | test/dm/firmware.c | 22 |
2 files changed, 23 insertions, 0 deletions
diff --git a/test/dm/Makefile b/test/dm/Makefile index d7f5d6b061..00acc7f242 100644 --- a/test/dm/Makefile +++ b/test/dm/Makefile @@ -17,6 +17,7 @@ obj-$(CONFIG_BLK) += blk.o obj-$(CONFIG_BOARD) += board.o obj-$(CONFIG_CLK) += clk.o obj-$(CONFIG_DM_ETH) += eth.o +obj-$(CONFIG_FIRMWARE) += firmware.o obj-$(CONFIG_DM_GPIO) += gpio.o obj-$(CONFIG_DM_I2C) += i2c.o obj-$(CONFIG_LED) += led.o diff --git a/test/dm/firmware.c b/test/dm/firmware.c new file mode 100644 index 0000000000..60fdcbb33f --- /dev/null +++ b/test/dm/firmware.c @@ -0,0 +1,22 @@ +// SPDX-License-Identifier: GPL-2.0+ +/* + * Copyright (C) 2018 Xilinx, Inc. + */ + +#include <common.h> +#include <dm.h> +#include <syscon.h> +#include <asm/test.h> +#include <dm/test.h> +#include <test/ut.h> + +/* Base test of firmware probe */ +static int dm_test_firmware_probe(struct unit_test_state *uts) +{ + struct udevice *dev; + + ut_assertok(uclass_get_device_by_name(UCLASS_FIRMWARE, + "sandbox-firmware", &dev)); + return 0; +} +DM_TEST(dm_test_firmware_probe, DM_TESTF_SCAN_FDT); |