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-rw-r--r--include/dm/test.h9
-rw-r--r--include/test/test.h10
2 files changed, 10 insertions, 9 deletions
diff --git a/include/dm/test.h b/include/dm/test.h
index 2c92d41278..b2adce730a 100644
--- a/include/dm/test.h
+++ b/include/dm/test.h
@@ -144,15 +144,6 @@ struct dm_test_state {
struct udevice *removed;
};
-/* Test flags for each test */
-enum {
- DM_TESTF_SCAN_PDATA = 1 << 0, /* test needs platform data */
- DM_TESTF_PROBE_TEST = 1 << 1, /* probe test uclass */
- DM_TESTF_SCAN_FDT = 1 << 2, /* scan device tree */
- DM_TESTF_FLAT_TREE = 1 << 3, /* test needs flat DT */
- DM_TESTF_LIVE_TREE = 1 << 4, /* needs live device tree */
-};
-
/* Declare a new driver model test */
#define DM_TEST(_name, _flags) UNIT_TEST(_name, _flags, dm_test)
diff --git a/include/test/test.h b/include/test/test.h
index 029288de88..ff92c39006 100644
--- a/include/test/test.h
+++ b/include/test/test.h
@@ -7,6 +7,7 @@
#define __TEST_TEST_H
#include <malloc.h>
+#include <linux/bitops.h>
/*
* struct unit_test_state - Entire state of test system
@@ -27,6 +28,15 @@ struct unit_test_state {
char actual_str[256];
};
+/* Test flags for each test */
+enum {
+ UT_TESTF_SCAN_PDATA = BIT(0), /* test needs platform data */
+ UT_TESTF_PROBE_TEST = BIT(1), /* probe test uclass */
+ UT_TESTF_SCAN_FDT = BIT(2), /* scan device tree */
+ UT_TESTF_FLAT_TREE = BIT(3), /* test needs flat DT */
+ UT_TESTF_LIVE_TREE = BIT(4), /* needs live device tree */
+};
+
/**
* struct unit_test - Information about a unit test
*