diff options
Diffstat (limited to 'test/dm/i2c.c')
| -rw-r--r-- | test/dm/i2c.c | 20 |
1 files changed, 10 insertions, 10 deletions
diff --git a/test/dm/i2c.c b/test/dm/i2c.c index c5939a165e..23d612eb81 100644 --- a/test/dm/i2c.c +++ b/test/dm/i2c.c @@ -10,19 +10,19 @@ #include <dm.h> #include <fdtdec.h> #include <i2c.h> +#include <asm/state.h> +#include <asm/test.h> #include <dm/device-internal.h> #include <dm/test.h> #include <dm/uclass-internal.h> -#include <dm/ut.h> #include <dm/util.h> -#include <asm/state.h> -#include <asm/test.h> +#include <test/ut.h> static const int busnum; static const int chip = 0x2c; /* Test that we can find buses and chips */ -static int dm_test_i2c_find(struct dm_test_state *dms) +static int dm_test_i2c_find(struct unit_test_state *uts) { struct udevice *bus, *dev; const int no_chip = 0x10; @@ -43,7 +43,7 @@ static int dm_test_i2c_find(struct dm_test_state *dms) } DM_TEST(dm_test_i2c_find, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); -static int dm_test_i2c_read_write(struct dm_test_state *dms) +static int dm_test_i2c_read_write(struct unit_test_state *uts) { struct udevice *bus, *dev; uint8_t buf[5]; @@ -60,7 +60,7 @@ static int dm_test_i2c_read_write(struct dm_test_state *dms) } DM_TEST(dm_test_i2c_read_write, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); -static int dm_test_i2c_speed(struct dm_test_state *dms) +static int dm_test_i2c_speed(struct unit_test_state *uts) { struct udevice *bus, *dev; uint8_t buf[5]; @@ -82,7 +82,7 @@ static int dm_test_i2c_speed(struct dm_test_state *dms) } DM_TEST(dm_test_i2c_speed, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); -static int dm_test_i2c_offset_len(struct dm_test_state *dms) +static int dm_test_i2c_offset_len(struct unit_test_state *uts) { struct udevice *bus, *dev; uint8_t buf[5]; @@ -99,7 +99,7 @@ static int dm_test_i2c_offset_len(struct dm_test_state *dms) } DM_TEST(dm_test_i2c_offset_len, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); -static int dm_test_i2c_probe_empty(struct dm_test_state *dms) +static int dm_test_i2c_probe_empty(struct unit_test_state *uts) { struct udevice *bus, *dev; @@ -114,7 +114,7 @@ static int dm_test_i2c_probe_empty(struct dm_test_state *dms) } DM_TEST(dm_test_i2c_probe_empty, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); -static int dm_test_i2c_bytewise(struct dm_test_state *dms) +static int dm_test_i2c_bytewise(struct unit_test_state *uts) { struct udevice *bus, *dev; struct udevice *eeprom; @@ -169,7 +169,7 @@ static int dm_test_i2c_bytewise(struct dm_test_state *dms) } DM_TEST(dm_test_i2c_bytewise, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); -static int dm_test_i2c_offset(struct dm_test_state *dms) +static int dm_test_i2c_offset(struct unit_test_state *uts) { struct udevice *eeprom; struct udevice *dev; |