From 1ca7e2062b4e8c3b211753dcb19c063b5b9b73ca Mon Sep 17 00:00:00 2001 From: Simon Glass Date: Wed, 23 Jul 2014 06:55:18 -0600 Subject: dm: Provide a function to scan child FDT nodes At present only root nodes in the device tree are scanned for devices. But some devices can have children. For example a SPI bus may have several children for each of its chip selects. Add a function which scans subnodes and binds devices for each one. This can be used for the root node scan also, so change it. A device can call this function in its bind() or probe() methods to bind its children. Signed-off-by: Simon Glass --- include/dm/test.h | 9 +++++++++ 1 file changed, 9 insertions(+) (limited to 'include/dm/test.h') diff --git a/include/dm/test.h b/include/dm/test.h index 409f1a3667..e8e1c0b24a 100644 --- a/include/dm/test.h +++ b/include/dm/test.h @@ -155,6 +155,15 @@ int testfdt_ping(struct udevice *dev, int pingval, int *pingret); int dm_check_operations(struct dm_test_state *dms, struct udevice *dev, uint32_t base, struct dm_test_priv *priv); +/** + * dm_check_devices() - check the devices respond to operations correctly + * + * @dms: Overall test state + * @num_devices: Number of test devices to check + * @return 0 if OK, -ve on error + */ +int dm_check_devices(struct dm_test_state *dms, int num_devices); + /** * dm_test_main() - Run all the tests * -- cgit v1.2.3