From e180c2b129016baf21086eca73767844e7eff185 Mon Sep 17 00:00:00 2001 From: Simon Glass Date: Tue, 28 Jul 2020 19:41:12 -0600 Subject: dm: Rename DM test flags to make them more generic The test flags used by driver model are currently not available to other tests. Rather than creating two sets of flags, make these flags generic by changing the DM_ prefix to UT_ and moving them to the test.h header. This will allow adding other test flags without confusion. Signed-off-by: Simon Glass --- test/dm/sf.c | 4 ++-- 1 file changed, 2 insertions(+), 2 deletions(-) (limited to 'test/dm/sf.c') diff --git a/test/dm/sf.c b/test/dm/sf.c index 0f2808fca4..cc1fc4d69a 100644 --- a/test/dm/sf.c +++ b/test/dm/sf.c @@ -65,7 +65,7 @@ static int dm_test_spi_flash(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_spi_flash, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); +DM_TEST(dm_test_spi_flash, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); /* Functional test that sandbox SPI flash works correctly */ static int dm_test_spi_flash_func(struct unit_test_state *uts) @@ -93,4 +93,4 @@ static int dm_test_spi_flash_func(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_spi_flash_func, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); +DM_TEST(dm_test_spi_flash_func, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); -- cgit v1.2.3