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| author | ChiYuan Huang <cy_huang@richtek.com> | 2022-07-19 17:52:45 +0300 |
|---|---|---|
| committer | Jonathan Cameron <Jonathan.Cameron@huawei.com> | 2022-08-16 00:29:57 +0300 |
| commit | 7898f31b0e7a6ba1ec9c7391e7ece9e31dd93262 (patch) | |
| tree | 63357416940782e99530e43ff8b5b78eb753bcbb /Documentation/ABI/testing/sysfs-bus-iio | |
| parent | 4396f45d211b6aa2f3a821f0a3a77c992335724b (diff) | |
| download | linux-7898f31b0e7a6ba1ec9c7391e7ece9e31dd93262.tar.xz | |
Documentation: ABI: testing: rtq6056: Update ABI docs
Add documentation for the usage of voltage channel integration time.
Signed-off-by: ChiYuan Huang <cy_huang@richtek.com>
Link: https://lore.kernel.org/r/1658242365-27797-4-git-send-email-u0084500@gmail.com
Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
Diffstat (limited to 'Documentation/ABI/testing/sysfs-bus-iio')
| -rw-r--r-- | Documentation/ABI/testing/sysfs-bus-iio | 11 |
1 files changed, 11 insertions, 0 deletions
diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio index e81ba6f5e1c8..7faec5b3a553 100644 --- a/Documentation/ABI/testing/sysfs-bus-iio +++ b/Documentation/ABI/testing/sysfs-bus-iio @@ -2038,3 +2038,14 @@ Description: Available range for the forced calibration value, expressed as: - a range specified as "[min step max]" + +What: /sys/bus/iio/devices/iio:deviceX/in_voltageX_sampling_frequency +What: /sys/bus/iio/devices/iio:deviceX/in_powerY_sampling_frequency +What: /sys/bus/iio/devices/iio:deviceX/in_currentZ_sampling_frequency +KernelVersion: 5.20 +Contact: linux-iio@vger.kernel.org +Description: + Some devices have separate controls of sampling frequency for + individual channels. If multiple channels are enabled in a scan, + then the sampling_frequency of the scan may be computed from the + per channel sampling frequencies. |